Machine Vision Products, Inc. (MVP), a global leader in advanced imaging and inspection technologies, will highlight its latest AI-driven inspection capabilities for SMT, microelectronics, hybrid assemblies, and advanced packaging at APEX EXPO 2026, taking place March 17–19 at the Anaheim Convention Center. Visitors to Booth 1739 will see live demonstrations showing how MVP integrates AI tools, deep learning, high-resolution imaging, and laser metrology to address the growing inspection challenges of modern electronics manufacturing.
Central to these demonstrations will be MVP’s latest Version 9 inspection software, which introduces an expanded suite of AI-assisted inspection tools designed to improve defect detection, streamline program development, and enhance classification accuracy. Version 9 enables manufacturers to leverage AI-driven analysis alongside MVP’s proven metrology-based algorithms, helping reduce false calls while improving inspection reliability across increasingly complex assemblies.
MVP’s powerful algorithms and innovative approaches to inspection and measurements, have proven their reliability and effectiveness with hundreds of customers and across many applications in the electronics industry.
Live demonstrations will be performed on MVP’s Versa Duo inspection system, combining high-resolution 2D imaging and laser measurement technologies to analyze both surface appearance and dimensional characteristics within a single inspection workflow.
As device geometries shrink and assembly complexity increases, manufacturers require inspection solutions capable of detecting increasingly subtle defects while maintaining high throughput and low false call rates. MVP’s approach combines metrology-based inspection algorithms with AI-assisted learning tools, enabling faster program development, improved defect classification, and greater inspection consistency across complex products.
At APEX EXPO 2026, MVP will demonstrate inspection workflows designed to support a wide range of advanced manufacturing applications, including:
- Wire and die inspection for microelectronics and hybrid devices
- Ball Grid Array (BGA) inspection and measurement
- Advanced semiconductor packaging inspection
- Hybrid assemblies requiring precision dimensional verification
- Surface Mount Technology (SMT) inspection for high-mix production
“These applications represent some of the most demanding inspection challenges in electronics manufacturing today,” said Dr. George Ayoub, President and CEO of Machine Vision Products. “Our focus is on combining AI-driven inspection software with our proven metrology techniques to help manufacturers detect defects earlier, reduce false calls, and maintain yield as product complexity continues to increase.
With more than 30 years of AOI innovation, MVP continues to advance inspection capabilities for next-generation electronics manufacturing while providing manufacturers with the tools needed to support traceability, data integration, and process optimization.”
Visitors to Booth 1739 are invited to see these inspection capabilities in action and speak with MVP experts about inspection strategies for SMT, microelectronics, hybrid assemblies, and packaging applications.
To learn more, visit www.visionpro.com.
