PEMTRON, an inspection equipment developer and supplier, is pleased to announce plans to exhibit at the TPCA Show, scheduled to take place Oct. 23-25, 2024 in Taipei, where it will showcase its latest innovations in inspection equipment. Visitors to Booth will have the opportunity to explore four state-of-the-art systems: POSEIDON, 8800AI, 8800FI and JUPITER, each designed to enhance precision, efficiency and quality control.
POSEIDON: Advanced Wafer Warpage Measurement and FC-BGA Bump Inspection
POSEIDON is PEMTRON’s cutting-edge solution for wafer warpage measurement and FC-BGA bump inspection. It quickly and accurately measures warpage across the entire wafer surface, analyzing flatness and coplanarity using precise 3D data. The system provides swift and accurate profile and mapping data, making it indispensable for high-precision applications. Additionally, POSEIDON excels in FC-BGA bump inspection, identifying fine defects with high-resolution imaging and performing a range of inspections, including PCB warpage, bump height, coplanarity, bridging, and missing bump detection. It supports various processes, such as wire bonding, bumped wafers, and Micro LED, ensuring accurate parameter measurement through 3D profiling.
8800AI: Intelligent Visual Inspection for FC-BGA and PCBs
The 8800AI is PEMTRON’s intelligent visual inspection system, designed for FC-BGA and various PCB applications. Utilizing advanced algorithms and artificial intelligence, the 8800AI detects defects such as foreign materials, stains, and scratches, significantly enhancing First Time Yield (FTY) rates. With the integration of PemBrain AI, the system supports full inspection of both the TOP and BOTTOM of PCBs through an automated logistics system. Visitors to the booth will witness live demonstrations of the 8800AI in action, showcasing its ability to revolutionize quality control processes.
JUPITER: Revolutionary 3D X-ray Inspection
PEMTRON’s JUPITER 3D X-ray Inspection System offers unparalleled precision and comprehensive in-line inspection capabilities. Leveraging PCT reconstruction-based processing, JUPITER provides flexible 3D and 2D inspection options, making it adaptable to various manufacturing environments. The system is equipped with an integrated optical camera for 2D vision inspection and utilizes advanced defect detection algorithms from PEMTRON’s proven AOI systems. The JUPITER system also supports process quality analysis through seamless data sharing with AOI and SPI systems, providing manufacturers with invaluable insights into their production processes.
Attendees are invited to explore these groundbreaking technologies and engage with PEMTRON’s expert team, who will be available to provide detailed insights and answer questions about the systems on display.
For more information about PEMTRON, please visit www.pemtron.com.
