PEMTRON, an inspection equipment developer and supplier, is pleased to announce that its D2 (Dual Lane & Dual Head) Series AOI and SPI system has received a Mexico Technology Award in the category of Inspection Equipment – SPI Systems. The award was announced during a ceremony that took place on Wednesday, September 11, 2024 during SMTA Guadalajara in Mexico.
The D2 introduces dual lanes and dual heads, allowing for the simultaneous inspection of two different PCBs, setting a new benchmark for inspection technology. This innovative capability enables the system to inspect diverse boards concurrently, such as 8way + 4way, 12way + 4way, and 8way + 8way configurations.
In addition to its advanced capabilities, the D2 System boasts a user-friendly interface with a sophisticated design. It includes a built-in library management system and an offline real-time debug station, making it easy to operate and manage. The system’s customizable design allows adjustments based on various inspection objects, reflecting thoughtful and well-engineered design principles.
Engineered for reliable performance, the D2 System features tele-centric lenses, high-speed CPUs, and advanced image processing capabilities, ensuring consistent and dependable operation.
“We are proud to have won a Mexico Technology Award for our D2. Our advanced inspection solutions are designed to enhance productivity, flexibility and overall manufacturing efficiency,” said Jaime Arreola, PEMTRON’s Mexico General Manager.
The Mexico Technology Awards acknowledge the latest innovations available in Mexico produced by OEM manufacturing equipment and materials suppliers during the last 12 months. For more information, visit www.mexicoems.com/mta-awards.
For more information about PEMTRON and its range of products, please visit www.pemtron.com.
