PEMTRON, an inspection equipment developer and supplier, is excited to announce its participation at SEMICON Korea 2025, taking place February 19-21, 2025, at COEX in Seoul, Korea. Visitors to Booth C862 will have the opportunity to explore PEMTRON’s featured product, the JUPITER 3D X-ray Inspection System, alongside video presentations of other cutting-edge solutions, including the 8800WIR, ZEUS, APOLLON, and MARS systems.
JUPITER 3D X-ray Inspection System: Precision Redefined
The JUPITER 3D X-ray Inspection System offers both 3D and 2D capabilities through advanced PCT reconstruction-based processing. Equipped with a high-resolution optical camera and integrated with PEMTRON’s proven AOI defect detection algorithms, JUPITER provides manufacturers with an exceptional tool for comprehensive in-line inspection and process quality analysis. Its seamless integration with SPI and AOI systems enables data sharing, delivering valuable insights into the production process and enhancing overall efficiency.
MARS: High-Speed Memory Module Inspection
The MARS system is PEMTRON’s high-speed Automated Visual Inspection (AVI) solution for memory modules. Built for precision and reliability, MARS utilizes advanced image processing technology to deliver accurate inspection results even in challenging environments. With its robust design and exceptional speed, MARS is an essential tool for manufacturers seeking to elevate quality control and production efficiency in memory module assembly.
APOLLON: Comprehensive Package Inspection
For package inspection, the APOLLON system stands out with its ability to handle a wide range of packages, including BGA, LGA, QFN, QFP, CSP, and SOP. Designed for real-time defect detection and automated reporting, APOLLON enhances manufacturing efficiency by promptly identifying and addressing issues. This ensures consistent quality standards throughout the packaging process while minimizing production downtime.
8800WI Wafer Inspection System: Advanced Imaging for Defect Detection
The 8800WI wafer inspection system incorporates state-of-the-art 2D and 3D imaging technologies to inspect various types of bumps, including micro bumps. Its advanced imaging capabilities enable the system to detect and address quality issues at an early stage of semiconductor manufacturing. The 8800WI ensures that even the smallest defects are identified and corrected, improving yield and product quality.
Visit PEMTRON at SEMICON Korea 2025
Attendees are encouraged to visit Booth C862 to experience PEMTRON’s innovative inspection solutions first-hand. Learn how PEMTRON’s advanced systems can transform inspection processes and drive production efficiency in the semiconductor and electronics manufacturing industries.
For more information about PEMTRON and its portfolio of inspection systems, visit www.pemtron.com.
