SMTA Europe will host the Electronics in Harsh Environments Conference in Amsterdam, Netherlands, from 17-19 May 2022.

The third session of the conference addresses electronics reliability, featuring the following presentations:

Microvia Technology Assessment for Space Applications
Maarten Cauwe, IMEC-Cmst

Examination of Failure Mechanisms in IGBT’s
Keith Bryant, KB Consultancy

SRAM Test Chip for Radiation Experiment
Kirsten Weide-Zaage, University of Hannover

Case Study for employing the Electrical Twin for Cleaning Process Evaluation
Tom Forsythe, KYZEN Corporation

Thermal Shock Testing of Conformal Coatings on Boards Either Cleaned / UnCleaned
Chris Brightwell, Humiseal

UV LED Conformal Coating Technologies: An Environmentally Friendly Solution for High Performance Applications
Marie Kaing, Abchimie

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Professional Development Course

Tuesday 17 May 2022

Design for Reliability and Reliability Testing of Packaging Interconnects under Harsh Environments

This course is included in conference registration!

John Lau, Ph.D. - Unimicron
John Lau, Ph.D. - Unimicron

The recent advances and trends of lead-free solder joint reliability are presented in this course. Emphasis is placed on the design for reliability (DFR) and reliability testing and data analysis.

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Your registration fee for the technical conference includes a professional development course on Tuesday, access to conference proceedings, refreshment breaks, lunch, entrance to the Expo and our popular welcome reception!

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