TRI to Feature Innovative Inspection Solutions at NEPCON Japan 2020

Test Research, Inc. (TRI), the leading Test and Inspection systems provider for the electronics manufacturing industry will join NEPCON Japan held at Tokyo Big Sight to showcase state-of-the-art Inspection Solution for Smart Factories. Visit booth #W1-42 to experience Smart Factory Inspection Solutions in action.

TRI is redefining the SMT Inspection industry with innovative Artificial Intelligence Algorithms which drastically decrease false calls and increase the production line’s productivity, while reducing the operational cost.

Meet the next generation of High-Speed Inspection Solutions at TRI’s booth. TRI is featuring the new TR7700Q SII 3D AOI with improved Image quality at industry leading speed. TRI is showcasing the Next-generation High-Speed In-line 3D CT AXI, TR7600F3D SII, soaring speeds as to twice to three times as fast as the previous model.

Discover TRI’s World-Class High-Speed 3D CT AXI TR7600 SIII for multiple industry applications. TRI will exhibit the Global Technology Award-winning TR7007Q series 3D SPI.  Furthermore, presenting the new Multi-Angle 3D AOI solution TR7500QE offering higher quality imaging for side view inspection.

Our experts will reveal the advantages TRI’s high performance hardware design can bring to your production. TRI’s systems are designed to interoperate with other manufacturing equipment to minimize downtime, optimize production quality and reduce operator workload.