Koh Young will Highlight its Industry-leading Full 3D Inspection Solutions at SMTA International

September 12, 2017 – Chandler, AZ – Koh Young America will highlight its industry-leading Full 3D inspection solutions and next-generation closed-loop KSMART Process Optimizer (KPO) at SMTA International on September 19-20 in Rosemont, Illinois. Conference attendees are cordially invited to visit booth 507 and learn how industry-leading 3D measurement systems and closed-loop process solutions from Koh Young Technology can help improve production throughput and yield.

SPI Systems

At the show, Koh Young America will demonstrate the industry’s fastest Full 3D measurement and inspection solution. The 8030-3 Solder Paste Inspection (SPI) solution combines multi-projection moire technology with Full 3D data-based process optimization and analytics to eliminate false calls and boost throughput. This system will also be demonstrated in-line at booth 407 with Fuji America. We will also highlight our flagship aSPIre3 with a feature set suitable for myriad challenges in demanding production environments. These systems continue to raise the benchmark standards in the industry.

AOI Systems

Several Koh Young Automated Optical Inspection (AOI) solutions will complement the revolutionary SPI equipment on display. Consisting of three models targeting different production environments, Koh Young will emphasize the Zenith platform – the world’s best-selling and first Full 3D AOI platform. The hardware technology and measurement algorithms within the Zenith series work together to identify defect sources and provide accurate inspection of components, joints, and more, regardless of the model.

Koh Young will Highlight its Industry-leading Full 3D Inspection Solutions at SMTA International
Koh Young America will highlight its industry-leading Full 3D inspection solutions and next-generation closed-loop KSMART Process Optimizer (KPO) at SMTA International on September 19-20 in Rosemont, Illinois

KSMART Process Optimizer

The KSMART process optimizer (KPO), which is powered by the Koh Young Intelligent Platform for adaptive learning, will accompany the best-in-class Full 3D measurement solutions. Combining real-time process monitoring with print parameters, KPO actively optimizes the process to boost yield and enable smart factories. KPO is comprised of three modules. The Print Advisor Module (PAM) uses diagnostic algorithms to automatically generate print parameter guidelines. The Printer Diagnostic Module (PDM) uses multiple anomaly-detection algorithms to actively optimize the print process and reduce false calls. The Printer Optimizer Module (POM) uses our adaptive learning engine to generate models that optimize process parameters. KPO improves SPI utilization, while providing closed-loop print process recommendations with many of the industry’s leading screen printers. The solution will be highlighted in the New Product Showcase in the Exhibit Hall Courtyard, as well as in booth 507.

Show Participation

Beyond its booth presence, Koh Young will participate in several show activities including topical round table discussions and interviews on the smart factory and product traceability. Additionally, we are proud to sponsor the highly-regarded SMTA International Technical Conference. Finally, Koh Young will be highlighted during the Technical Tour focused on Test, Inspection, and Measurement during both days of the show. The tours provide a terrific opportunity to participate in technology focused tours displaying the latest solutions in a small group setting with no pressure.

After visiting with us at the show, you will understand why Koh Young has become the preferred solution for 3D inspection and measurement, With over 10,000 inspection systems installed, we simply the Absolute No. 1 inspection company in the world.

Mr. Juan Arango, Managing Director at Koh Young America

If you cannot attend the show to visit us in Booth 507, you can learn more about Koh Young Technology and its best-in-class inspection solutions at www.kohyoung.com.